Now Published    Volume 2 Sampling Techniques for Vibrational Spectroscopy L. Andrews, University of Virginia, Charlottesville, VA, USA S. J. Bajic, Iowa State University, Ames, IA, USA K. D. Bartle, University of Leeds, Leeds, UK S. L. Berets, Harrick Scientific Corporation, Ossining, NY, USA R. J. Berry, Kwansei Gakuin University, Nishinomiya , Japan M. O. Bulanin, St Petersburg University, St Petersburg, Russia Y. J. Chabal, Lucent Technologies, Murray Hill, NJ, USA J. M. Chalmers, The University of Nottingham, Nottingham, UK J. W. Childers, ManTech Environmental Technology, Inc., Research Triangle Park, NC, USA F. C. Clarke, Pfizer Inc., Sandwich, UK M. Claybourn, AstraZeneca, Macclesfield, UK R. M. Corn, University of Wisconsin-Madison, Madison WI, USA D. J. Dahm, Pella, IA, USA K. D. Dahm, Rowan University, Glassboro, NJ, USA M. de la Guardia, University of Valencia, Burjassot (Valencia), Spain P. Dhamelincourt, Université de Lille I, Villeneuve D'Ascq Cedex, France W. M. Doyle, Axiom Analytical, Inc., Irvine, CA, USA A. J. Eilert, Bran+Luebbe, Inc., Buffalo Grove, IL, USA S. Ekgasit, Chulalongkorn University, Bangkok, Thailand J. R. Ferraro, Argonne National Laboratory, Argonne, IL, USA J. Fitzpatrick, SensIR Technologies, Danbury, CT, USA C. R. Flach, Rutgers University, Newark, NJ, USA P. M. Fredericks, Queensland University of Technology, Brisbane, Australia B. L. Frey, Lake Forest College, Lake Forest, IL, USA S. Garrigues, University of Valencia, Burjassot (Valencia), Spain P. R. Griffiths , University of Idaho, Moscow, ID, USA A. S. Haka, Massachusetts Institute of Technology, Cambridge, MA, USA S. V. Hammond, Pfizer Inc., Sandwich, UK R. W. Hannah, Frye Island, ME, USA L. M. Hanssen, National Institute of Standards and Technology, Gaithersburg, MD, USA P. L. Hanst, Infrared Analysis, Inc., Anaheim, CA, USA J. W. Hellgeth, The SRN Company, LLC, Cumming, GA, USA P. J. Hendra, Crawley, Hants, UK H. Hoffmann, Vienna University of Technology, Vienna, Austria Y. Inouye, University of Osaka, Osaka, Japan H. Ishida, Case Western Reserve University, Cleveland, OH, USA U. A. Jayasooriya, University of East Anglia, Norwich, UK R. W. Jones, Iowa State University, Ames, IA, USA K. S. Kalasinsky, Armed Forces Institute for Pathology, Rockville, MD, USA V. F. Kalasinsky, Armed Forces Institute for Pathology, Rockville, MD, USA J. Kattner, Vienna University of Technology, Vienna, Austria S. Kawata, University of Osaka, Osaka, Japan L. H. Kidder, Spectral Dimensions, Inc., Olney, MD, USA W. Kiefer, Universität Wurzburg, Wurzburg, Germany D. K. Killinger, University of South Florida, Tampa, FL, USA E-H. Korte, ISAS Department Berlin, Berlin-Adlershof, Germany B. Lendl, Vienna University of Technology, Vienna, Austria E. N. Lewis, Spectral Dimensions, Inc., Olney, MD, USA I. R. Lewis, Kaiser Optical Systems, Ann Arbor, MI, USA M. L. Lewis, University of Idaho, Moscow, ID, USA J. F. McClelland, Iowa State University, Ames, IA, USA & MTEC Photoacoustics, Inc., Ames, IA, USA P. J. Melling, Remspec Corporation, Sturbridge, MA, USA R. Mendelsohn, Rutgers University, Newark, NJ, USA G. T. Merklin, On-Line Technologies, Inc., East Hartford, CT, USA M. Milosevic, Harrick Scientific Corporation, Ossining, NY, USA J. Mink, University of Veszprém, Veszprém, Hungary, & Institute of Isotope and Surface Chemistry, Budapest, Hungary F. Mirabella, Equistar Chemicals, Cincinnati, OH, USA B. Mizaikoff, Georgia Institute of Technology, Atlanta, GA, USA M. D. Morris, University of Michigan, Ann Arbor, MI, USA M. P. Nelson, ChemIcon Inc., Pittsburgh, USA J. M. Olinger, Eli Lilly and Co., Indianapolis, IN, USA Y. Ozaki, Kwansei Gakuin University, Nishinomiya, Japan H. M. Pollock, Lancaster University, Lancaster, UK C. H. Polsky, Arizona State University, Tempe, AZ, USA J. Popp, Universität Wurzburg, Wurzburg, Germany J. F. Power, McGill University, Montreal, Canada J. A. Reffner, SensIR Technologies, Danbury, CT, USA A. Röseler, ISAS Department Berlin, Berlin-Adlershof, Germany S. S. Rosenblum, Corning Inc., Wilmington, NC, USA G. M. Russwurm, ManTech Environmental Technology, Inc., Research Triangle Park, NC, USA B. Schrader, Essen, Germany D. A. Smith, University of Leeds, Leeds, UK K. Snail, Naval Research Laboratory, Washington, DC, USA A. J. Sommer, Miami University, Oxford, OH, USA R. L. Spellicy, Industrial Monitor and Control Corp., Round Rock, TX, USA D. L. Stokes, Oak Ridge National Laboratory, Oak Ridge, TN, USA M. Thomson, Remspec Corporation, Sturbridge, MA, USA T. R. Todd, Ocean Optics, Inc., El Dorado Hills, CA, USA P. J. Treado, ChemIcon Inc., Pittsburgh, PA, USA J. Umemura, Kyoto University, Kyoto-fu, Japan M. W. Urban, The University of Southern Mississippi, Hattiesburg, MS, USA E. Van Valkenburg, High Pressure Diamond Optics, Inc., Tucson, AZ, USA T. Visser, Utrecht University, Utrecht, The Netherlands T. Vo-Dinh, Oak Ridge National Laboratory, Oak Ridge, TN, USA J. D. Webb, Shell Chemical Co., Houston, TX, USA S. C. Weibel, GWC Instruments, Madison, WI, USA D. L. Wetzel, Kansas State University, Manhattan, KS, USA C. L. Wilkins, University of Arkansas, Fayetteville, AK, USA S. P. Willson, University of Virginia, Charlottesville, VA, USA