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Volume 3
Sample Characterization and Spectral Data Processing
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A. H. Aastveit, Agricultural University of Norway, Ås, Norway
R. J. Berry, University of Idaho, Moscow, ID, USA
B. T. Bowie, University of Idaho, Moscow, ID, USA
C. Castiglioni, Politecnico di Milano, Milan, Italy
J. M. Chalmers, The University of Nottingham, Nottingham, UK
B. Chase, E. I. du Pont de Nemours and Co., Inc., Wilmington, DE, USA
E. W. Ciurczak, Purdue Pharma LP, Ardsley, NY, USA
J. Coates, Coates Consulting, Newtown, CT, USA
A. N. Davies, ISAS, Dortmund, Germany
L. K. DeNoyer, Spectrum Square Associates, Inc., Ithaca, NY, USA
J. G. Dodd, Spectrum Square Associates, Inc., Ithaca, NY, USA
J. Durig, University of Missouri at Kansas City, MO, USA
H. G. M. Edwards, University of Bradford, Bradford, UK
T. Fearn, University College London, London, UK
J. E. Franke, US Tobacco Manufacturing, Nashville, TN, USA
W. O. George, University of Glamorgan, Wales, UK
P. R. Griffiths, University of Idaho, Moscow, ID, USA
P. Groner, University of Missouri at Kansas City, MO, USA
M. Gussoni, Politecnico di Milano, Milan, Italy
R. W. Hannah, Frye Island, ME, USA & Naples, FL, USA
T. Hasegawa, Kobe Pharmaceutical University, Kobe, Japan
M. C. Hemmer, CREON·LAB·CONTROL AG, Europaallee 27-29, D-50226 Frechen, Germany
T. Hieda, Saitama University, Saitama, Japan
M. Hotokka, Åbo Akademi University, Åbo, Finland
T. Isaksson, Agricultural University of Norway, Ås, Norway
J. K. Kauppinen, University of Turku, Turku, Finland
I. M. Kvalheim, University of Bergen, Bergen, Norway
R. Lewis, University of Glamorgan, Wales, UK
I. R. Lewis, Kaiser Optical Systems, Ann Arbor, MI, USA
S-C. Lo, Gamma-Metrics, San Diego, CA, USA
S. R. Lowry, Nicolet Instrument Corp., Madison, WI, USA
H. Mark, Mark Electronics, Suffern, NY, USA
H. Matsuura, Hiroshima University, Higashi-Hiroshima, Japan
D. W. Mayo, Bowdoin College, Maine, ME, USA
K. Nakamoto, Fox Point, WI, USA
I. Noda, The Procter and Gamble Company, Cincinnati, OH, USA
Y. Ozaki, Kwansei Gakuin University, Nishinomiya, Japan
P. E. Saarinen, University of Turku, Turku, Finland
A. Sakamoto, Saitama University, Saitama, Japan
H. F. Shurvell, Queen’s University, Kingston, Canada
M. Tasumi, Saitama University, Saitama, Japan
H. Torii, Shizuoka University, Shizuoka, Japan
L. G. Weyer, Hercules Incorporated, Wilmington, DE, USA
H. Yoshida, Hiroshima University, Higashi-Hiroshima, Japan
G. Zerbi, Politecnico di Milano, Milan, Italy
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